The thermal emittance of opaque samples is complementary to their infrared reflectance. Our emissiometers are therefore designed for broad-band measurements of the infrared reflectance. Gl and metal surfaces are used as high – and low-emitting standards.

不透明的樣品的熱通量密度對(duì)他們的紅外反射率是相輔相成的。因此我們emissiometers專為寬帶測(cè)量紅外反射率。玻璃和金屬表面是作為高——low-emitting標(biāo)準(zhǔn)。

Emissiometer R

This te is designed for the measurement of tubular samples. The infrared radiation is emitted by a heated semi-cylindrical tunnel, in which the samples (maximum diameter 70mm) have to be placed axially. The reflected radiation is measured integrally in the wavelength range from 8µm to 14µm.

Emissiometer R這種類型的設(shè)計(jì)是用來(lái)測(cè)量的管殼式樣品。紅外輻射發(fā)射加熱,具有隧道橫徑管樣品(軸)須被放置的地方。反射輻射測(cè)量在波長(zhǎng)范圍從整體到14µm 8µm。

Emissiometer K1

This te is designed for measurements of plane surfaces. The diffuse infrared radiation comes through the exit hole of a diffuse-gold coated integrating sphere with a diameter of 50mm. The measured area has a diameter aller than 10mm. The reflected radiation is measured integrally in the wavelength range from 8µm to 14µm

Emissiometer K1這種類型是專為測(cè)量飛機(jī)的表面。漫反射紅外輻射來(lái)通過(guò)出口孔涂層的diffuse-gold積分球,直徑50毫米。直徑的測(cè)量的面積小于10毫米。反射輻射測(cè)量在波長(zhǎng)范圍從整體到14µm 8µm

EmissiometerK2

This te has an additional detector which is sensitive around a wavelength of 5.1µm for measurements of highly selective solar absorber coatings.

 Emissiometer K2這種類型擁有一個(gè)額外的檢測(cè)器波長(zhǎng)敏感的5.1µm周圍進(jìn)行度量的高度選擇性的太陽(yáng)能吸收涂層。

Emissiometer K3

This te has an additional detector which is sensitive around a wavelength of 3.9µm for measurements of highly selective solar absorber coatings for the application as medium to high temperature absorbers.

Emissiometer K3這種類型擁有一個(gè)額外的檢測(cè)器波長(zhǎng)敏感的3.9µm周圍進(jìn)行度量的高度選擇性吸收涂層的太陽(yáng)能應(yīng)用高溫吸波材料,作為工作介質(zhì)。

U-meter

The U-meter is especially designed for the measurement of the u-value of windows and will be ready for sale soon

U-meter主要適合的U-meter測(cè)量中的u-value的窗戶,將準(zhǔn)備銷售很快